CORDIS Project
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This project aims to enhance electron microscopy techniques for material analysis by utilizing advanced pixelated detectors. It seeks to improve imaging efficiency and resolution, enabling better understanding of materials at atomic levels, particularly in fields like materials science and biology.
Electron microscopy is a key technique for imaging and analysis of materials.
Although aberration correction has made atomic resolution possible at low accelerating voltages, beam damage remains a critical limitation for many types of materials.
The imaging modes currently in use today are inefficient in terms of the number of transmitted electrons detected and the way in which these are used to derive information.
Current detectors integrate over details in the angular distribution of scattered…
UNIVERSITAT WIEN
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