CORDIS Project
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This project focuses on improving the reliability of emerging transistor technologies through a detailed study of defect behavior. It aims to develop a simulation framework that addresses various reliability issues, enhancing the performance of next-generation electronic devices.
This proposal presents an interdisciplinary, forward looking, training-by-research plan in the field of physical reliability modeling of emerging transistors and materials beyond 2020.
Its main goal is development and validation of a simulation framework which self-consistently considers the main reliability phenomena including bias temperature instability, hot-carrier degradation, and self-heating.
These effects were suggested to be the response of interface and oxide defects/precursors which c…
INTERUNIVERSITAIR MICRO-ELECTRONICA CENTRUM
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